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X-ray diffractometer with high brightness source Rigaku SmartLab 9kW

Name: X-ray diffractometer with high brightness source Rigaku SmartLab 9kW
Location: CEITEC Vysoké učení technické v Brně
Instrument description: Rigaku Smartlab 9kW is a novel high-resolution X-ray diffractometer dedicated to characterization of thin films and nano-structures. Due to its modularity, the instrument allows for large variety of X-ray diffraction and scattering techniques. The non-destructive analytical techniques reveal information about crystal structure, chemical composition, and physical properties of materials, thin films, and nano-structures.
Research group: CF: CEITEC Nano
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X-ray diffractometer with high brightness source Rigaku SmartLab 9kW

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