Vacuum FTIR Vertex80v + microscope Hyperion 3000 KIT - polarizors, VIS detector Bruker Vertex80v + Hyperion 3000

Name:	Vacuum FTIR Vertex80v + microscope Hyperion 3000 KIT - polarizors, VIS detector Bruker Vertex80v + Hyperion 3000
Instrument:	Spectrometer Bruker Vertex 80v, Infrared microscop
Technology / Methodology:	Optical measurements
Location:	CEITEC Vysoké učení technické v Brně
Instrument description:	Instrument consists of a combination of Fourier infrared spectrometer with infrared microscope. In the spectrometer, one can perform transmission and reflection experiments on samples dimension of roughly 1 mm2 and more in the full frequency range offered by the spectrometer, 30-14 000 cm-1. The microscope is used for measurements of either small or spatially inhomogeneous samples essentially down to the diffraction limit in the far field, it means roughly 3 at 3000 cm-1. The frequency range is however limited by the microscope detectors to 600-6000 cm-1. The highlight of this microscope is the focal plane array (FPA) detector that allows simultaneous recording of 128x128 matrix of spectra in the frequency range 900-5000 cm-1.
More information / Supplier:	http://cfnano.ceitec.cz/instrument.php?id=13
Research group:	CF: CEITEC Nano

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