Mgr. Mojmír Meduňa, Ph.D.

2016

• ISA, F; SALVALAGLIO, M; DASILVA, YAR; MEDUNA, M; BARGET, M; JUNG, A; KREILIGER, T; ISELLA, G; ERNI, R; PEZZOLI, F; BONERA, E; NIEDERMANN, P; GRONING, P; MONTALENTI, F; VON KANEL, H, 2016:Highly Mismatched, Dislocation-Free SiGe/Si Heterostructures. ADVANCED MATERIALS 28 (5), p. 884 - 888.
• MEDUNA, M; FALUB, CV; ISA, F; MARZEGALLI, A; CHRASTINA, D; ISELLA, G; MIGLIO, L; DOMMANN, A; VON KANEL, H, 2016:Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling. JOURNAL OF APPLIED CRYSTALLOGRAPHY 49 , p. 976 - 986.
• ROZBORIL, J; MEDUNA, M; FALUB, CV; ISA, F; VON KANEL, H, 2016:Strain relaxation in Ge microcrystals studied by high-resolution X-ray diffraction. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 213 (2), p. 463 - 469.
• TABOADA, AG; MEDUNA, M; SALVALAGLIO, M; ISA, F; KREILIGER, T; FALUB, CV; MEIER, EB; MULLER, E; MIGLIO, L; ISELLA, G; VON KANEL, H, 2016:GaAs/Ge crystals grown on Si substrates patterned down to the micron scale. JOURNAL OF APPLIED PHYSICS 119 (5)

2014

• MEDUNA, M; FALUB, CV; ISA, F; CHRASTINA, D; KREILIGER, T; ISELLA, G; VON KANEL, H, 2014:Reconstruction of crystal shapes by X-ray nanodiffraction from three-dimensional superlattices. JOURNAL OF APPLIED CRYSTALLOGRAPHY 47 , p. 2030 - 2037.

2012

• MEDUNA, M; RUZICKA, J; CAHA, O; BURSIK, J; SVOBODA, M, 2012:Precipitation in silicon wafers after high temperature preanneal studied by X-ray diffraction methods. PHYSICA B-CONDENSED MATTER 407 (15), p. 3002 - 3005.