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Scanning Probe Microscope Bruker Dimension Icon

Name:	Scanning Probe Microscope Bruker Dimension Icon
Instrument:	Dimension Icon
Technology / Methodology:	Probe microscopy & Nanomanipulation
Location:	CEITEC Vysoké učení technické v Brně
Instrument description:	The Dimension Icon’s superior resolution provides the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of highresolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection.
More information / Supplier:	http://cfnano.ceitec.cz/instrument.php?id=16
Research group:	CF: CEITEC Nano

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