The ICN+T represents the convergence of the former International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM) and Nano, which were first combined in Basel, Switzerland in 2006 (list of the former meeting sites). This conference will cover a range of topics in nanoscale science and technology, addressing the interdisciplinary nature of this strategic field.
Approximately 50 plenary and invited presentations on the latest developments in nanoscale science and technology will be given by leading scientists. Organizators expect up to 700 attendees from around the globe to present their latest research.
In addition to a diverse technical program, vendors will exhibit the latest equipment available for nanoscale science and technology. The exhibit will surround the poster presentations, providing many opportunities for discussions between attendees and vendors.
More information about conference:
Conference chairman from CEITEC BUT:
prof. RNDr. Tomáš Šikola, CSc.
| Telefon: | +420 54114 2707 |
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| E-mail: | |
| Kancelář: |
