Mgr. Petr Klapetek, Ph.D.

2017

• KLAPETEK, P; MARTINEK, J; GROLICH, P; VALTR, M; KAUR, NJ, 2017:Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER 108 , p. 841 - 850.
• KLENOVSKY, P; ZUDA, J; KLAPETEK, P; HUMLICEK, J, 2017:Ellipsometry of surface layers on a 1-kg sphere from natural silicon. APPLIED SURFACE SCIENCE 421 , p. 542 - 546.

2016

• STADLER, P; FARKA, D; COSKUN, H; GLOWACKI, ED; YUMUSAK, C; UIBERLACKER, LM; HILD, S; LEONAT, LN; SCHARBER, MC; KLAPETEK, P; MENON, R; SARICIFTCI, NS, 2016:Local order drives the metallic state in PEDOT:PSS. JOURNAL OF MATERIALS CHEMISTRY C 4 (29), p. 6982 - 6987.

2015

• KLAPETEK, P; VALTR, M; PICCO, L; PAYTON, OD; MARTINEK, J; YACOOT, A; MILES, M, 2015:Large area high-speed metrology SPM system. NANOTECHNOLOGY 26 (6)
• MARTINEK, J; KLAPETEK, P; CAMPBELL, AC, 2015:Methods for topography artifacts compensation in scanning thermal microscopy. ULTRAMICROSCOPY 155 , p. 55 - 61.

2014

• KLAPETEK, P; NECAS, D, 2014:Independent analysis of mechanical data from atomic force microscopy. MEASUREMENT SCIENCE & TECHNOLOGY 25 (4)
• NECAS, D; CUDEK, V; VODAK, J; OHLIDAL, M; KLAPETEK, P; BENEDIKT, J; RUGNER, K; ZAJICKOVA, L, 2014:Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry. MEASUREMENT SCIENCE & TECHNOLOGY 25 (11)

2013

• KLAPETEK, P; PICCO, L; PAYTON, O; YACOOT, A; MILES, M, 2013:Error mapping of high-speed AFM systems. MEASUREMENT SCIENCE & TECHNOLOGY 24 (2)
• NECAS, D; KLAPETEK, P, 2013:One-dimensional autocorrelation and power spectrum density functions of irregular regions. ULTRAMICROSCOPY 124 , p. 13 - 19.

2012

• FOJT, L; KLAPETEK, P; STRASAK, L; VETTERL, V, 2012:Fibrinogen and cellular adherability on differently treated titanium as implants. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10 (1), p. 232 - 238.
• KLAPETEK, P; VALTR, M; BURSIK, P, 2012:Non-equidistant scanning approach for millimetre-sized SPM measurements. NANOSCALE RESEARCH LETTERS 7
• KLAPETEK, P; VALTR, M; DUCHON, V; SOBOTA, J, 2012:Voice coil-based scanning probe microscopy. NANOSCALE RESEARCH LETTERS 7 , p. 1 - 7.
• LAZAR, J; HRABINA, J; SERY, M; KLAPETEK, P; CIP, O, 2012:Multiaxis interferometric displacement measurement for local probe microscopy. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10 (1), p. 225 - 231.

2011

• BURSIKOVA, V; BLAHOVA, O; KARASKOVA, M; ZAJICKOVA, L; JASEK, O; FRANTA, D; KLAPETEK, P; BURSIK, J, 2011:MECHANICAL PROPERTIES OF ULTRANANOCRYSTALLINE THIN FILMS DEPOSITED USING DUAL FREQUENCY DISCHARGES. CHEMICKE LISTY 105 , p. S98 - S101.
• KLAPETEK, P; KOENDERS, L, 2011:Nanoscale metrology. MEASUREMENT SCIENCE & TECHNOLOGY 22 (9)
• KLAPETEK, P; VALTR, M; NECAS, D; SALYK, O; DZIK, P, 2011:Atomic force microscopy analysis of nanoparticles in non-ideal conditions. NANOSCALE RESEARCH LETTERS 6

2010

• DANZEBRINK, HU; KOENDERS, L; PICOTTO, GB; LASSILA, A; WANG, SHH; KLAPETEK, P, 2010:Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings. METROLOGIA 47

Pracoviště 1:

Vysoké učení technické v Brně - CEITEC VUT