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NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE

Name:	NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE
Technology / Methodology:	Optical measurements
Location:	CEITEC Vysoké učení technické v Brně
Instrument description:	The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities.
More information / Supplier:	http://cfnano.ceitec.cz/instrument.php?id=10
Research group:	CF: CEITEC Nano

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