Name: | Keithley 4200-SCS Parameter Analyzer |
Location: | CEITEC Vysoké učení technické v Brně |
Instrument description: | The 4200-SCS is a modular, fully integrated parameter analyzer that performs electrical characterization of materials, semiconductor devices and processes. Consisting of Source Measure Units for IV characterization, Capacitance-Voltage module for AC impedance measurements, and Ultra-fast Pulsed IV that performs waveform capture, and transient IV measurements, the 4200-SCS provides the researcher or engineer with critical parameters needed for materials research, semiconductor device design, development or production. |
Research group: | CF: CEITEC Nano |
If you would like to use this equipment contact the administrator: |
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