Name: | Ion polisher Fischione TEM Mill 1050 |
Location: | CEITEC Vysoké učení technické v Brně |
Instrument description: | Machine for creating thin electron transparent specimens for TEM. TEM Mill incorporates two independently adjustable ion sources, liquid nitrogen specimen cooling, automatic gas control, and a vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. Tilt angles are adjustable in the range from –10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is available. The TEM Mill includes a microscope with CCD camera for better specimen viewing and polishing process control. |
Research group: | CF: CEITEC Nano |
If you would like to use this equipment contact the administrator: |
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