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Cross section/broad beam ion polisher Leica EM TIC3X

Name:	Cross section/broad beam ion polisher Leica EM TIC3X
Location:	CEITEC Vysoké učení technické v Brně
Instrument description:	Machine for polishing broad range of materialographic samples (metals, ceramics, plastics, organic species, composites of various types, porous materials) in cross-section or in planar polishing mode. Features three Ar ion guns displaced mutually by 45°, aiming at the same point, independently controllable. Three sample stages are available: one for ion milling in cross section, a rotary stage for planar polishing and a cryo stage for cross-section polishing of sensitive samples.
Research group:	CF: CEITEC Nano

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