LEIS Workshop 2017 - Brno CEITEC BUT

The oral contributions are listed according to the LEIS workshop program:

• Peter Bauer (JKU Linz), Electronic stopping of He ions in oxides.
• Philipp Brüner (ION-TOF GmbH), Finding the optimum measurement conditions for low energy ion scattering.
• Stanislav Prusa (CEITEC BUT), Contamination of Fe-Rh thin layers by carbon studied with help of HS-LEIS.
• Andrey Zameshin (University of Twente), Ruthenium growth on B, C and B4C: combining surface and in-depth information from LEIS.
• Ulrike Diebold (TU Wien), Using Ion Spectroscopies for Unraveling Atomic-Scale Processes Relevant for Solid Oxide Fuel Cells (invited).
• Rik ter Veen (Tascon GmbH), Quantification of LEIS data.
• Barbara Bruckner (JKU Linz), Tantalum round robin No. 2, summary.
• Tomas Sikola,  CEITEC Nano Research Infrastructure.
• Daniel Primetzhofer (Uppsala University), Electronic interactions of medium-energy ions with solids: recent results and their implications for high-resolution depth profiling (invited).
• Mingshu Chen (Xiamen University, China), Phase Diagrams of Supported Bimetal Nanoparticles: HS-LEIS & XPS Studies.

Invited speakers are willing to discuss their presentations by private communication.

Posters

• Cristiane Vilas Boas (University of Twente) Oxygen diffusion characterization by depthresolved low energy ion spectroscopy
• Petr Babor (CEITEC BUT) Surface Analysis of Etched CdTe Crystals
• Thomas Grehl (ION TOF) Low Energy Ion Scattering (LEIS) Analysis of ALD Deposited GaSb Films on SiO2
• Philipp Brüner (ION TOF) Pd deposited on Al2O3 analyzed by Low Energy Ion Scattering (LEIS)